Introduction Application Specification Advantage Of Using Nanotechnology Manual And Maintenance Safety And Package

White light interferometry is a widely used technique for measurement of surface topography of objects over large areas. A white light interferometer is consisted of a white light source, optical system and a CCD sensor.

Based on this method, the measurement range varies from 5 nanometers to a few millimeters. Accuracy and precision depends on the coherence of light source, vertical stage accuracy, vibration of the table, specimen reflection and roughness, and CCD sensor error. Considering above-mentioned factors, achievable accuracy is about 5 nm.

In this system, the sample moves along the Z-axis, and the sensor captures an image of the sample after each movement. Collected data is then imported to GWYDDION software to show graphical results. Roughness investigation, coating thickness, surface topography, materials shape, etc. can be shown on the graphs.

  • Measurement of surface topography down to nanometers
  • Thickness measurement down to nanometers
  • Determination of surface roughness

Details of technical specifications are presented in the following Table.

 

An optical surface profiler is able to measure surface topography, coating thickness, etc. down to nanometers.

  • Place the device in an environment free of dust and air pollution as its optical components are very sensitive.
  • Place the device on a table with minimum vibration.
  • For more details on how to use the device, refer to the device catalog and user guide.
  • Device is sensitive to impact, so packing must be done in a way that any probable impact should not damage the device performance.
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